Title
100-nm thick single-phase wurtzite BAlN films with boron contents over 10%
Date Issued
01 August 2017
Access level
open access
Resource Type
journal article
Author(s)
Li X.
Wang S.
Liu H.
Detchprohm T.
Dupuis R.D.
Publisher(s)
Wiley-VCH Verlag
Abstract
Growing thicker BAlN films while maintaining single-phase wurtzite structure and boron content over 10% has been challenging. In this study, we report on the growth of 100 nm-thick single-phase wurtzite BAlN films with boron contents up to 14.4% by MOCVD. Flow-modulated epitaxy was employed to increase diffusion length of group-III atoms and reduce parasitic reactions between the metalorganics and NH3. A large growth efficiency of ∼2000 μm mol−1 was achieved as a result. Small B/III ratios up to 17% in conjunction with high temperatures up to 1010 °C were utilized to prevent formation of the cubic phase and maintain wurtzite structure.
Volume
254
Issue
8
Language
English
OCDE Knowledge area
Física de partículas, Campos de la Física
Scopus EID
2-s2.0-85026893372
Source
Physica Status Solidi (B) Basic Research
ISSN of the container
03701972
Sponsor(s)
This work was supported by the U.S. National Science Foundation under DMR-1410874. RDD acknowledges support of the Steve W. Chaddick Endowed Chair in Electro-Optics and the Georgia Research Alliance. XL acknowledges support of the KAUST startup and baseline funding. The authors acknowledge beneficial discussion of RBS data with Dr. Daniel Tseng from EAG Laboratories.
Sources of information: Directorio de Producción Científica Scopus